Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl
The effect of program and model structure on mc/dc test adequacy coverage
ICSE, 2008.
@inproceedings{ICSE-2008-RajanWH, author = "Ajitha Rajan and Michael W. Whalen and Mats Per Erik Heimdahl", booktitle = "{Proceedings of the 30th International Conference on Software Engineering}", doi = "10.1145/1368088.1368111", editor = "Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn", isbn = "978-1-60558-079-1", pages = "161--170", publisher = "{ACM}", title = "{The effect of program and model structure on mc/dc test adequacy coverage}", year = 2008, }