The effect of program and model structure on mc/dc test adequacy coverage
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Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl
The effect of program and model structure on mc/dc test adequacy coverage
ICSE, 2008.

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@inproceedings{ICSE-2008-RajanWH,
	author        = "Ajitha Rajan and Michael W. Whalen and Mats Per Erik Heimdahl",
	booktitle     = "{Proceedings of the 30th International Conference on Software Engineering}",
	doi           = "10.1145/1368088.1368111",
	editor        = "Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn",
	isbn          = "978-1-60558-079-1",
	pages         = "161--170",
	publisher     = "{ACM}",
	title         = "{The effect of program and model structure on mc/dc test adequacy coverage}",
	year          = 2008,
}

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