Rafik Kheddam, Oum-El-Kheir Aktouf, Ioannis Parissis
An Extended LLRP Model for RFID System Test and Diagnosis
ICST, 2012.
@inproceedings{ICST-2012-KheddamAP, author = "Rafik Kheddam and Oum-El-Kheir Aktouf and Ioannis Parissis", booktitle = "{Proceedings of the Fifth IEEE International Conference on Software Testing, Verification and Validation}", doi = "10.1109/ICST.2012.138", isbn = "978-1-4577-1906-6", pages = "529--538", publisher = "{IEEE Computer Society}", title = "{An Extended LLRP Model for RFID System Test and Diagnosis}", year = 2012, }