Rafik Kheddam, Oum-El-Kheir Aktouf, Ioannis Parissis
An Extended LLRP Model for RFID System Test and Diagnosis
ICST, 2012.
@inproceedings{ICST-2012-KheddamAP,
author = "Rafik Kheddam and Oum-El-Kheir Aktouf and Ioannis Parissis",
booktitle = "{Proceedings of the Fifth IEEE International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2012.138",
isbn = "978-1-4577-1906-6",
pages = "529--538",
publisher = "{IEEE Computer Society}",
title = "{An Extended LLRP Model for RFID System Test and Diagnosis}",
year = 2012,
}











