Generating Succinct Test Cases Using Don’t Care Analysis
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Cuong Nguyen, Hiroaki Yoshida, Mukul R. Prasad, Indradeep Ghosh, Koushik Sen
Generating Succinct Test Cases Using Don’t Care Analysis
ICST, 2015.

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@inproceedings{ICST-2015-0001YPGS,
	author        = "Cuong Nguyen and Hiroaki Yoshida and Mukul R. Prasad and Indradeep Ghosh and Koushik Sen",
	booktitle     = "{Proceedings of the Eighth IEEE International Conference on Software Testing, Verification and Validation}",
	doi           = "10.1109/ICST.2015.7102590",
	isbn          = "978-1-4799-7125-1",
	pages         = "1--10",
	publisher     = "{IEEE}",
	title         = "{Generating Succinct Test Cases Using Don’t Care Analysis}",
	year          = 2015,
}

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