Cuong Nguyen, Hiroaki Yoshida, Mukul R. Prasad, Indradeep Ghosh, Koushik Sen
Generating Succinct Test Cases Using Don’t Care Analysis
ICST, 2015.
@inproceedings{ICST-2015-0001YPGS,
author = "Cuong Nguyen and Hiroaki Yoshida and Mukul R. Prasad and Indradeep Ghosh and Koushik Sen",
booktitle = "{Proceedings of the Eighth IEEE International Conference on Software Testing, Verification and Validation}",
doi = "10.1109/ICST.2015.7102590",
isbn = "978-1-4799-7125-1",
pages = "1--10",
publisher = "{IEEE}",
title = "{Generating Succinct Test Cases Using Don’t Care Analysis}",
year = 2015,
}
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