A lifespan-aware reliability scheme for RAID-based flash storage
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Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn
A lifespan-aware reliability scheme for RAID-based flash storage
SAC, 2011.

SAC 2011
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@inproceedings{SAC-2011-LeeLKB,
	author        = "Sehwan Lee and Bitna Lee and Kern Koh and Hyokyung Bahn",
	booktitle     = "{Proceedings of the 26th Symposium on Applied Computing}",
	doi           = "10.1145/1982185.1982266",
	editor        = "William C. Chu and W. Eric Wong and Mathew J. Palakal and Chih-Cheng Hung",
	isbn          = "978-1-4503-0113-8",
	pages         = "374--379",
	publisher     = "{ACM}",
	title         = "{A lifespan-aware reliability scheme for RAID-based flash storage}",
	year          = 2011,
}

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