Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn
A lifespan-aware reliability scheme for RAID-based flash storage
SAC, 2011.
@inproceedings{SAC-2011-LeeLKB,
author = "Sehwan Lee and Bitna Lee and Kern Koh and Hyokyung Bahn",
booktitle = "{Proceedings of the 26th Symposium on Applied Computing}",
doi = "10.1145/1982185.1982266",
editor = "William C. Chu and W. Eric Wong and Mathew J. Palakal and Chih-Cheng Hung",
isbn = "978-1-4503-0113-8",
pages = "374--379",
publisher = "{ACM}",
title = "{A lifespan-aware reliability scheme for RAID-based flash storage}",
year = 2011,
}











