Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn
A lifespan-aware reliability scheme for RAID-based flash storage
SAC, 2011.
@inproceedings{SAC-2011-LeeLKB, author = "Sehwan Lee and Bitna Lee and Kern Koh and Hyokyung Bahn", booktitle = "{Proceedings of the 26th Symposium on Applied Computing}", doi = "10.1145/1982185.1982266", editor = "William C. Chu and W. Eric Wong and Mathew J. Palakal and Chih-Cheng Hung", isbn = "978-1-4503-0113-8", pages = "374--379", publisher = "{ACM}", title = "{A lifespan-aware reliability scheme for RAID-based flash storage}", year = 2011, }