Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
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Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
STOC, 2003.

STOC 2003
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@inproceedings{STOC-2003-Ben-SassonSVW,
	author        = "Eli Ben-Sasson and Madhu Sudan and Salil P. Vadhan and Avi Wigderson",
	booktitle     = "{Proceedings of the 35th Annual ACM Symposium on Theory of Computing}",
	doi           = "10.1145/780542.780631",
	isbn          = "1-58113-674-9",
	pages         = "612--621",
	publisher     = "{ACM}",
	title         = "{Randomness-efficient low degree tests and short PCPs via epsilon-biased sets}",
	year          = 2003,
}

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