Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
STOC, 2003.
@inproceedings{STOC-2003-Ben-SassonSVW, author = "Eli Ben-Sasson and Madhu Sudan and Salil P. Vadhan and Avi Wigderson", booktitle = "{Proceedings of the 35th Annual ACM Symposium on Theory of Computing}", doi = "10.1145/780542.780631", isbn = "1-58113-674-9", pages = "612--621", publisher = "{ACM}", title = "{Randomness-efficient low degree tests and short PCPs via epsilon-biased sets}", year = 2003, }