Bernhard K. Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt
Model-Based Mutation Testing of an Industrial Measurement Device
TAP, 2014.
@inproceedings{TAP-2014-AichernigAJKKSS,
author = "Bernhard K. Aichernig and Jakob Auer and Elisabeth Jöbstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Birgit Vera Schmidt",
booktitle = "{Proceedings of the Eighth International Conference on Tests and Proofs}",
doi = "10.1007/978-3-319-09099-3_1",
isbn = "978-3-319-09098-6",
pages = "1--19",
publisher = "{Springer International Publishing}",
series = "{Lecture Notes in Computer Science}",
title = "{Model-Based Mutation Testing of an Industrial Measurement Device}",
volume = 8570,
year = 2014,
}
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