Model-Based Mutation Testing of an Industrial Measurement Device
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Bernhard K. Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt
Model-Based Mutation Testing of an Industrial Measurement Device
TAP, 2014.

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@inproceedings{TAP-2014-AichernigAJKKSS,
	author        = "Bernhard K. Aichernig and Jakob Auer and Elisabeth Jöbstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Birgit Vera Schmidt",
	booktitle     = "{Proceedings of the Eighth International Conference on Tests and Proofs}",
	doi           = "10.1007/978-3-319-09099-3_1",
	isbn          = "978-3-319-09098-6",
	pages         = "1--19",
	publisher     = "{Springer International Publishing}",
	series        = "{Lecture Notes in Computer Science}",
	title         = "{Model-Based Mutation Testing of an Industrial Measurement Device}",
	volume        = 8570,
	year          = 2014,
}

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