Travelled to:
1 × USA
Collaborated with:
G.Moreno K.Wallnau
Talks about:
properti (2) standard (1) statist (1) predict (1) assembl (1) toward (1) compon (1) model (1) level (1) label (1)
Person: Scott Hissam
DBLP: Hissam:Scott
Contributed to:
Wrote 1 papers:
- CBSE-2002-MorenoHW #component #empirical #modelling #predict #standard #statistics #towards
- Statistical Models for Empirical Component Properties and Assembly-Level Property Predictions: Toward Standard Labeling (GM, SH, KW), p. 10.