Travelled to:
2 × USA
Collaborated with:
S.Tokumoto T.Zhang J.Gao O.Aktouf K.Sakamoto K.Shimojo H.Washizaki H.Yoshida M.R.Prasad I.Ghosh
Talks about:
test (2) increment (1) industri (1) incompat (1) softwar (1) program (1) generat (1) coverag (1) automat (1) analysi (1)
Person: Tadahiro Uehara
DBLP: Uehara:Tadahiro
Contributed to:
Wrote 3 papers:
- SEKE-2015-ZhangGAU #analysis #mobile
- Test Model and Coverage Analysis for Location-based Mobile Services (TZ, JG, OEKA, TU), pp. 80–86.
- ICST-2014-TokumotoSSUW #automation #industrial #locality
- Semi-automatic Incompatibility Localization for Re-engineered Industrial Software (ST, KS, KS, TU, HW), pp. 91–94.
- FSE-2016-YoshidaTPGU #c #c++ #fine-grained #generative #incremental #named #source code #testing
- FSX: a tool for fine-grained incremental unit test generation for C/C++ programs (HY, ST, MRP, IG, TU), pp. 1052–1056.