BibSLEIGH
BibSLEIGH corpus
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Used together with:
circuit (1)
ecl (1)
parametr (1)
seri (1)
generat (1)

Stem pateg$ (all stems)

1 papers:

DACDAC-1985-OgiharaSM #automation #generative #named #parametricity #testing
PATEGE: an automatic DC parametric test generation system for series gated ECL circuits (TO, SS, SM), pp. 212–218.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.