Alberto González-Sanchez, Rui Abreu, Hans-Gerhard Groß, Arjan J. C. van Gemund
Prioritizing tests for fault localization through ambiguity group reduction
ASE, 2011.
@inproceedings{ASE-2011-Gonzalez-SanchezAGG,
author = "Alberto González-Sanchez and Rui Abreu and Hans-Gerhard Groß and Arjan J. C. van Gemund",
booktitle = "{Proceedings of the 26th IEEE/ACM International Conference on Automated Software Engineering}",
doi = "10.1109/ASE.2011.6100153",
isbn = "978-1-4577-1638-6",
pages = "83--92",
publisher = "{IEEE}",
title = "{Prioritizing tests for fault localization through ambiguity group reduction}",
year = 2011,
}











