José Campos, Rui Abreu, Gordon Fraser, Marcelo d'Amorim
Entropy-based test generation for improved fault localization
ASE, 2013.
@inproceedings{ASE-2013-CamposAFd,
author = "José Campos and Rui Abreu and Gordon Fraser and Marcelo d'Amorim",
booktitle = "{Proceedings of the 28th IEEE/ACM International Conference on Automated Software Engineering}",
doi = "10.1109/ASE.2013.6693085",
pages = "257--267",
publisher = "{IEEE}",
title = "{Entropy-based test generation for improved fault localization}",
year = 2013,
}