Pavneet Singh Kochhar, Yuan Tian, David Lo
Potential biases in bug localization: do they matter?
ASE, 2014.
@inproceedings{ASE-2014-KochharTL, author = "Pavneet Singh Kochhar and Yuan Tian and David Lo", booktitle = "{Proceedings of the 29th IEEE/ACM International Conference on Automated Software Engineering}", doi = "10.1145/2642937.2642997", isbn = "978-1-4503-3013-8", pages = "803--814", publisher = "{ACM}", title = "{Potential biases in bug localization: do they matter?}", year = 2014, }