Wai Kuan Yip, K. G. Law, Wen Jau Lee
Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data
CASE, 2007.
@inproceedings{CASE-2007-YipLL,
author = "Wai Kuan Yip and K. G. Law and Wen Jau Lee",
booktitle = "{Proceedings of the Third International Conference on Automation Science and Engineering}",
doi = "10.1109/COASE.2007.4341700",
isbn = "978-1-4244-1154-2",
pages = "478--483",
publisher = "{IEEE}",
title = "{Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data}",
year = 2007,
}











