Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data
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Wai Kuan Yip, K. G. Law, Wen Jau Lee
Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data
CASE, 2007.

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@inproceedings{CASE-2007-YipLL,
	author        = "Wai Kuan Yip and K. G. Law and Wen Jau Lee",
	booktitle     = "{Proceedings of the Third International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2007.4341700",
	isbn          = "978-1-4244-1154-2",
	pages         = "478--483",
	publisher     = "{IEEE}",
	title         = "{Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data}",
	year          = 2007,
}

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