Simone Pampuri, Andrea Schirru, Giuseppe Fazio, Giuseppe De Nicolao
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing
CASE, 2011.
@inproceedings{CASE-2011-PampuriSFN,
author = "Simone Pampuri and Andrea Schirru and Giuseppe Fazio and Giuseppe De Nicolao",
booktitle = "{Proceedings of the Seventh International Conference on Automation Science and Engineering}",
doi = "10.1109/CASE.2011.6042425",
isbn = "978-1-4577-1730-7",
pages = "244--249",
publisher = "{IEEE}",
title = "{Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing}",
year = 2011,
}











