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Travelled to:
1 × Canada
1 × Italy
1 × Korea
Collaborated with:
S.Pampuri A.Schirru C.D.Luca G.A.Susto A.Beghi G.Fazio Federica Acerbi Josef Obiltschnig Patrick Richter
Talks about:
semiconductor (6) manufactur (6) process (4) metrolog (3) virtual (3) multilevel (2) approach (2) predict (2) mainten (2) control (2)

Person: Giuseppe De Nicolao

DBLP DBLP: Nicolao:Giuseppe_De

Contributed to:

CASE 20122012
CASE 20112011
CASE 20102010
CASE 20182018

Wrote 7 papers:

CASE-2012-PampuriSSLBN #multi #process
Multistep virtual metrology approaches for semiconductor manufacturing processes (SP, AS, GAS, CDL, AB, GDN), pp. 91–96.
CASE-2012-SustoSPNB #approach
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control (GAS, AS, SP, GDN, AB), pp. 358–363.
CASE-2011-PampuriSFN #multi
Multilevel Lasso applied to Virtual Metrology in semiconductor manufacturing (SP, AS, GF, GDN), pp. 244–249.
CASE-2011-PampuriSLN #maintenance #predict
Proportional hazard model with ℓ1 Penalization applied to Predictive Maintenance in semiconductor manufacturing (SP, AS, CDL, GDN), pp. 250–255.
CASE-2010-SchirruPN #maintenance #predict #process #robust
Particle filtering of hidden Gamma processes for robust Predictive Maintenance in semiconductor manufacturing (AS, SP, GDN), pp. 51–56.
CASE-2010-SchirruPN10a #multi #process #statistics
Multilevel statistical process control of asynchronous multi-stream processes in semiconductor manufacturing (AS, SP, GDN), pp. 57–62.
CASE-2018-AcerbiNORL #modelling #robust
Accuracy and Robustness Against Covariate Shift of Water Chiller Models (FA, GDN, JO, PR, CDL), pp. 809–816.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.