Gian Antonio Susto, Andrea Schirru, Simone Pampuri, Giuseppe De Nicolao, Alessandro Beghi
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control
CASE, 2012.
@inproceedings{CASE-2012-SustoSPNB,
author = "Gian Antonio Susto and Andrea Schirru and Simone Pampuri and Giuseppe De Nicolao and Alessandro Beghi",
booktitle = "{Proceedings of the Eighth International Conference on Automation Science and Engineering}",
doi = "10.1109/CoASE.2012.6386416",
isbn = "978-1-4673-0429-0",
pages = "358--363",
publisher = "{IEEE}",
title = "{An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control}",
year = 2012,
}











