Ying-Jen Chen, Bo-Cheng Wang, Jei-Zheng Wu, Yi-Chia Wu, Chen-Fu Chien
Big data analytic for multivariate fault detection and classification in semiconductor manufacturing
CASE, 2017.
@inproceedings{CASE-2017-ChenWWWC,
author = "Ying-Jen Chen and Bo-Cheng Wang and Jei-Zheng Wu and Yi-Chia Wu and Chen-Fu Chien",
booktitle = "{Proceedings of the 13th International Conference on Automation Science and Engineering}",
doi = "10.1109/COASE.2017.8256190",
isbn = "978-1-5090-6781-7",
pages = "731--736",
publisher = "{IEEE}",
title = "{Big data analytic for multivariate fault detection and classification in semiconductor manufacturing}",
year = 2017,
}











