Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing
CASE, 2018.
@inproceedings{CASE-2018-RostamiBCY,
author = "Hamideh Rostami and Jakey Blue and Argon Chen and Claude Yugma",
booktitle = "{Proceedings of the 14th International Conference on Automation Science and Engineering}",
doi = "10.1109/COASE.2018.8560435",
isbn = "978-1-5386-3593-3",
pages = "1316--1321",
publisher = "{IEEE}",
title = "{Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing}",
year = 2018,
}











