Travelled to:
1 × India
1 × Taiwan
Collaborated with:
A.Chen C.Yugma S.Hsueh S.Dauzère-Pérès P.Vialletelle Hamideh Rostami
Talks about:
semiconductor (2) manufactur (2) integr (2) metrolog (1) diagnosi (1) deterior (1) schedul (1) process (1) outlook (1) optimum (1)
Person: Jakey Blue
DBLP: Blue:Jakey
Contributed to:
Wrote 3 papers:
- CASE-2014-YugmaBDV #bibliography #integration #process #scheduling
- Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook (CY, JB, SDP, PV), pp. 93–98.
- CASE-2009-ChenHB
- Optimum sampling for track PEB CD Integrated Metrology (AC, SH, JB), pp. 439–442.
- CASE-2018-RostamiBCY #modelling
- Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing (HR, JB, AC, CY), pp. 1316–1321.