Minimum test patterns for residue networks
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Douglas C. Bossen, Daniel L. Ostapko, Arvind M. Patel, Martin S. Schmookler
Minimum test patterns for residue networks
DAC, 1971.

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@inproceedings{DAC-1971-BossenOPS,
	author        = "Douglas C. Bossen and Daniel L. Ostapko and Arvind M. Patel and Martin S. Schmookler",
	booktitle     = "{Proceedings of the Eighth Design Automation Workshop}",
	doi           = "10.1145/800158.805083",
	pages         = "278--284",
	publisher     = "{ACM}",
	title         = "{Minimum test patterns for residue networks}",
	year          = 1971,
}

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