Travelled to:1 × USA
Collaborated with:D.L.Ostapko A.M.Patel M.S.Schmookler
Talks about:pattern (1) network (1) minimum (1) residu (1) test (1)
Person: Douglas C. Bossen
DBLP: Bossen:Douglas_C=
Contributed to:
1971Wrote 1 papers:
- DAC-1971-BossenOPS #network
- Minimum test patterns for residue networks (DCB, DLO, AMP, MSS), pp. 278–284.