Top down design and testability of VLSI circuits
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Philippe Basset, Gabriele Saucier
Top down design and testability of VLSI circuits
DAC, 1982.

DAC 1982
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@inproceedings{DAC-1982-BassetS,
	author        = "Philippe Basset and Gabriele Saucier",
	booktitle     = "{Proceedings of the 19th Design Automation Conference}",
	doi           = "10.1145/800263.809299",
	pages         = "851--857",
	publisher     = "{ACM/IEEE}",
	title         = "{Top down design and testability of VLSI circuits}",
	year          = 1982,
}

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