@inproceedings{DAC-1982-MinS,
	author        = "Yinghua Min and Stephen Y. H. Su",
	booktitle     = "{Proceedings of the 19th Design Automation Conference}",
	doi           = "10.1145/800263.809234",
	pages         = "384--392",
	publisher     = "{ACM/IEEE}",
	title         = "{Testing functional faults in VLSI}",
	year          = 1982,
}