An integrated design for testability and automatic test pattern generation system: An overview
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Erwin Trischler
An integrated design for testability and automatic test pattern generation system: An overview
DAC, 1984.

DAC 1984
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@inproceedings{DAC-1984-Trischler,
	acmid         = "800797",
	author        = "Erwin Trischler",
	booktitle     = "{Proceedings of the 21st Design Automation Conference}",
	isbn          = "0-8186-0542-1",
	pages         = "209--215",
	publisher     = "{ACM/IEEE}",
	title         = "{An integrated design for testability and automatic test pattern generation system: An overview}",
	year          = 1984,
}

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