Travelled to:
1 × USA
Collaborated with:
∅
Talks about:
overview (1) testabl (1) pattern (1) generat (1) automat (1) system (1) integr (1) design (1) test (1)
Person: Erwin Trischler
DBLP: Trischler:Erwin
Contributed to:
Wrote 1 papers:
- DAC-1984-Trischler #automation #design #generative #overview #perspective #testing
- An integrated design for testability and automatic test pattern generation system: An overview (ET), pp. 209–215.