A heuristic chip-level test generation algorithm
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Daniel S. Barclay, James R. Armstrong
A heuristic chip-level test generation algorithm
DAC, 1986.

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@inproceedings{DAC-1986-BarclayA,
	author        = "Daniel S. Barclay and James R. Armstrong",
	booktitle     = "{Proceedings of the 23rd Design Automation Conference}",
	doi           = "10.1145/318013.318054",
	pages         = "257--262",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{A heuristic chip-level test generation algorithm}",
	year          = 1986,
}

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