Daniel S. Barclay, James R. Armstrong
A heuristic chip-level test generation algorithm
DAC, 1986.
@inproceedings{DAC-1986-BarclayA, author = "Daniel S. Barclay and James R. Armstrong", booktitle = "{Proceedings of the 23rd Design Automation Conference}", doi = "10.1145/318013.318054", pages = "257--262", publisher = "{IEEE Computer Society Press}", title = "{A heuristic chip-level test generation algorithm}", year = 1986, }