Philip S. Yu, C. Mani Krishna, Yann-Hang Lee
VLSI Circuit Testing Using an Adaptive Optimization Model
DAC, 1987.
@inproceedings{DAC-1987-YuKL,
author = "Philip S. Yu and C. Mani Krishna and Yann-Hang Lee",
booktitle = "{Proceedings of the 24th Design Automation Conference}",
doi = "10.1145/37888.37948",
pages = "399--406",
publisher = "{IEEE Computer Society Press / ACM}",
title = "{VLSI Circuit Testing Using an Adaptive Optimization Model}",
year = 1987,
}