Michael J. Batek, John P. Hayes
Test-Set Preserving Logic Transformations
DAC, 1992.
@inproceedings{DAC-1992-BatekH,
acmid = "113938.149565",
author = "Michael J. Batek and John P. Hayes",
booktitle = "{Proceedings of the 29th Design Automation Conference}",
isbn = "0-8186-2822-7",
pages = "454--458",
publisher = "{IEEE Computer Society Press}",
title = "{Test-Set Preserving Logic Transformations}",
year = 1992,
}











