ATPG for Heat Dissipation Minimization During Scan Testing
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Seongmoon Wang, Sandeep K. Gupta
ATPG for Heat Dissipation Minimization During Scan Testing
DAC, 1997.

DAC 1997
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@inproceedings{DAC-1997-WangG,
	author        = "Seongmoon Wang and Sandeep K. Gupta",
	booktitle     = "{Proceedings of the 34th Design Automation Conference}",
	doi           = "10.1145/266021.266298",
	isbn          = "0-89791-920-3",
	pages         = "614--619",
	publisher     = "{ACM Press}",
	title         = "{ATPG for Heat Dissipation Minimization During Scan Testing}",
	year          = 1997,
}

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