BibSLEIGH — Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores

Li Chen, Xiaoliang Bai, Sujit Dey
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
DAC, 2001.

DAC 2001

@inproceedings{DAC-2001-ChenBD,
	author        = "Li Chen and Xiaoliang Bai and Sujit Dey",
	booktitle     = "{Proceedings of the 38th Design Automation Conference}",
	doi           = "10.1145/378239.378498",
	isbn          = "1-58113-297-2",
	pages         = "317--320",
	publisher     = "{ACM}",
	title         = "{Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores}",
	year          = 2001,
}

Li Chen, Xiaoliang Bai, Sujit DeyTesting for Interconnect Crosstalk Defects Using On-Chip Embedded Processor CoresDAC, 2001.

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Li Chen, Xiaoliang Bai, Sujit Dey
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
DAC, 2001.