A scan BIST generation method using a markov source and partial bit-fixing
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Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz
A scan BIST generation method using a markov source and partial bit-fixing
DAC, 2003.

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@inproceedings{DAC-2003-LiYRP,
	author        = "Wei Li and Chaowen Yu and Sudhakar M. Reddy and Irith Pomeranz",
	booktitle     = "{Proceedings of the 40th Design Automation Conference}",
	doi           = "10.1145/775832.775974",
	isbn          = "1-58113-688-9",
	pages         = "554--559",
	publisher     = "{ACM}",
	title         = "{A scan BIST generation method using a markov source and partial bit-fixing}",
	year          = 2003,
}

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