Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies
DAC, 2005.
@inproceedings{DAC-2005-DililloGPVB,
author = "Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian",
booktitle = "{Proceedings of the 42nd Design Automation Conference}",
doi = "10.1145/1065579.1065804",
isbn = "1-59593-058-2",
pages = "857--862",
publisher = "{ACM}",
title = "{Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies}",
year = 2005,
}