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Travelled to:
2 × Germany
2 × USA
5 × France
Collaborated with:
P.Girard S.Pravossoudovitch L.Dilillo M.Bastian A.Bosio A.Ney C.Landrault V.Gouin N.Badereddine Y.Bonhomme L.Guiller A.Touati P.Bernardi M.S.Reorda L.B.Zordan A.Todri R.A.Fonseca J.Azevedo A.Todri-Sanial G.Prenat J.Alvarez-Herault K.Mackay
Talks about:
sram (6) test (5) analysi (3) design (3) power (3) fault (3) core (3) cell (3) technolog (2) techniqu (2)

Person: Arnaud Virazel

DBLP DBLP: Virazel:Arnaud

Contributed to:

DATE 20152015
DATE 20132013
DATE 20122012
DAC 20102010
DATE 20092009
DATE 20082008
DATE 20072007
DAC 20052005
DATE v1 20042004

Wrote 9 papers:

DATE-2015-TouatiBDGVBR #functional #power management #source code #testing
Exploring the impact of functional test programs re-used for power-aware testing (AT, AB, LD, PG, AV, PB, MSR), pp. 1277–1280.
DATE-2013-ZordanBDGTVB #fault #power management
Test solution for data retention faults in low-power SRAMs (LBZ, AB, LD, PG, AT, AV, NB), pp. 442–447.
DATE-2012-AzevedoVBDGTPAM #architecture #fault
Impact of resistive-open defects on the heat current of TAS-MRAM architectures (JA, AV, AB, LD, PG, ATS, GP, JAH, KM), pp. 532–537.
DAC-2010-FonsecaDBGPVB #analysis #reliability #simulation #statistics
A statistical simulation method for reliability analysis of SRAM core-cells (RAF, LD, AB, PG, SP, AV, NB), pp. 853–856.
DATE-2009-NeyDGPVBG #fault
A new design-for-test technique for SRAM core-cell stability faults (AN, LD, PG, SP, AV, MB, VG), pp. 1344–1348.
DATE-2008-NeyGPVBG
A Design-for-Diagnosis Technique for SRAM Write Drivers (AN, PG, SP, AV, MB, VG), pp. 1480–1485.
DATE-2007-NeyGLPVB #analysis #fault
Slow write driver faults in 65nm SRAM technology: analysis and March test solution (AN, PG, CL, SP, AV, MB), pp. 528–533.
DAC-2005-DililloGPVB #analysis #comparison #fault #injection
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies (LD, PG, SP, AV, MB), pp. 857–862.
DATE-v1-2004-BonhommeGGLPV #design #power management
Design of Routing-Constrained Low Power Scan Chains (YB, PG, LG, CL, SP, AV), pp. 62–67.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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