Secure scan: a design-for-test architecture for crypto chips
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Bo Yang, Kaijie Wu, Ramesh Karri
Secure scan: a design-for-test architecture for crypto chips
DAC, 2005.

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@inproceedings{DAC-2005-YangWK,
	author        = "Bo Yang and Kaijie Wu and Ramesh Karri",
	booktitle     = "{Proceedings of the 42nd Design Automation Conference}",
	doi           = "10.1145/1065579.1065617",
	isbn          = "1-59593-058-2",
	pages         = "135--140",
	publisher     = "{ACM}",
	title         = "{Secure scan: a design-for-test architecture for crypto chips}",
	year          = 2005,
}

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