Characterizing Process Variation in Nanometer CMOS
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Kanak Agarwal, Sani R. Nassif
Characterizing Process Variation in Nanometer CMOS
DAC, 2007.

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@inproceedings{DAC-2007-AgarwalN,
	author        = "Kanak Agarwal and Sani R. Nassif",
	booktitle     = "{Proceedings of the 44th Design Automation Conference}",
	doi           = "10.1145/1278480.1278582",
	pages         = "396--399",
	publisher     = "{IEEE}",
	title         = "{Characterizing Process Variation in Nanometer CMOS}",
	year          = 2007,
}

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