Lin Huang, Feng Yuan, Qiang Xu
On reliable modular testing with vulnerable test access mechanisms
DAC, 2008.
@inproceedings{DAC-2008-HuangYX,
author = "Lin Huang and Feng Yuan and Qiang Xu",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391681",
isbn = "978-1-60558-115-6",
pages = "834--839",
publisher = "{ACM}",
title = "{On reliable modular testing with vulnerable test access mechanisms}",
year = 2008,
}











