Xiaochun Yu, R. D. (Shawn) Blanton
Multiple defect diagnosis using no assumptions on failing pattern characteristics
DAC, 2008.
@inproceedings{DAC-2008-YuB,
author = "Xiaochun Yu and R. D. (Shawn) Blanton",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391567",
isbn = "978-1-60558-115-6",
pages = "361--366",
publisher = "{ACM}",
title = "{Multiple defect diagnosis using no assumptions on failing pattern characteristics}",
year = 2008,
}











