Travelled to:1 × France
2 × Germany
4 × USA
Collaborated with:W.C.Tam O.Poku X.Yu J.E.Nelson J.G.Brown R.Desineni X.Ren V.G.Tavares S.Biswas P.Li L.T.Pileggi T.Zanon N.Patil W.Maly
Talks about:diagnosi (3) multipl (2) circuit (2) failur (2) detect (2) defect (2) autom (2) test (2) use (2) dfm (2)
Person: R. D. (Shawn) Blanton
DBLP: Blanton:R=_D=_(Shawn)
Contributed to:
2015
201120092008200620062005Wrote 8 papers:
- DATE-2015-RenTB #detection #learning #statistics
- Detection of illegitimate access to JTAG via statistical learning in chip (XR, VGT, RD(B), pp. 109–114.
- DAC-2011-TamB #question
- To DFM or not to DFM? (WCT, RD(B), pp. 65–70.
- DAC-2009-TamPB #automation #validation
- Automated failure population creation for validating integrated circuit diagnosis methods (WCT, OP, RD(B), pp. 708–713.
- DAC-2008-TamPB #analysis #automation #layout #locality #precise #using
- Precise failure localization using automated layout analysis of diagnosis candidates (WCT, OP, RD(B), pp. 367–372.
- DAC-2008-YuB #fault #multi #using
- Multiple defect diagnosis using no assumptions on failing pattern characteristics (XY, RD(B), pp. 361–366.
- DAC-2006-NelsonBDB #detection #multi #physics
- Multiple-detect ATPG based on physical neighborhoods (JEN, JGB, RD, RD(B), pp. 1099–1102.
- DATE-2006-NelsonZDBPMB #fault
- Extraction of defect density and size distributions from wafer sort test results (JEN, TZ, RD, JGB, NP, WM, RD(B), pp. 913–918.
- DATE-2005-BiswasLBP #specification
- Specification Test Compaction for Analog Circuits and MEMS (SB, PL, RD(B, LTP), pp. 164–169.