Dimin Niu, Yiran Chen, Cong Xu, Yuan Xie
Impact of process variations on emerging memristor
DAC, 2010.
@inproceedings{DAC-2010-NiuCXX,
author = "Dimin Niu and Yiran Chen and Cong Xu and Yuan Xie",
booktitle = "{Proceedings of the 47th Design Automation Conference}",
doi = "10.1145/1837274.1837495",
isbn = "978-1-4503-0002-5",
pages = "877--882",
publisher = "{ACM}",
title = "{Impact of process variations on emerging memristor}",
year = 2010,
}











