Peter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski
Fully X-tolerant, very high scan compression
DAC, 2010.
@inproceedings{DAC-2010-WohlWNG,
author = "Peter Wohl and John A. Waicukauski and Frederic Neuveux and Emil Gizdarski",
booktitle = "{Proceedings of the 47th Design Automation Conference}",
doi = "10.1145/1837274.1837366",
isbn = "978-1-4503-0002-5",
pages = "362--367",
publisher = "{ACM}",
title = "{Fully X-tolerant, very high scan compression}",
year = 2010,
}











