Wangyang Zhang, Xin Li, Rob A. Rutenbar
Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference
DAC, 2010.
@inproceedings{DAC-2010-ZhangLR,
author = "Wangyang Zhang and Xin Li and Rob A. Rutenbar",
booktitle = "{Proceedings of the 47th Design Automation Conference}",
doi = "10.1145/1837274.1837342",
isbn = "978-1-4503-0002-5",
pages = "262--267",
publisher = "{ACM}",
title = "{Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference}",
year = 2010,
}











