Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim
Interconnect reliability modeling and analysis for multi-branch interconnect trees
DAC, 2015.
@inproceedings{DAC-2015-ChenTSHK,
author = "Hai-Bao Chen and Sheldon X.-D. Tan and Valeriy Sukharev and Xin Huang and Taeyoung Kim",
booktitle = "{Proceedings of the 52nd Annual Design Automation Conference}",
doi = "10.1145/2744769.2747953",
isbn = "978-1-4503-3520-1",
pages = "6",
publisher = "{ACM}",
title = "{Interconnect reliability modeling and analysis for multi-branch interconnect trees}",
year = 2015,
}