Interconnect reliability modeling and analysis for multi-branch interconnect trees
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Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim
Interconnect reliability modeling and analysis for multi-branch interconnect trees
DAC, 2015.

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@inproceedings{DAC-2015-ChenTSHK,
	author        = "Hai-Bao Chen and Sheldon X.-D. Tan and Valeriy Sukharev and Xin Huang and Taeyoung Kim",
	booktitle     = "{Proceedings of the 52nd Annual Design Automation Conference}",
	doi           = "10.1145/2744769.2747953",
	isbn          = "978-1-4503-3520-1",
	pages         = "6",
	publisher     = "{ACM}",
	title         = "{Interconnect reliability modeling and analysis for multi-branch interconnect trees}",
	year          = 2015,
}

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