Travelled to:3 × USA
Collaborated with:S.X.Tan X.Huang T.Yu H.Chen T.Kim V.Joshi A.Torres K.Agarwal D.Sylvester D.Blaauw
Talks about:interconnect (2) model (2) electromigr (1) reliabl (1) network (1) analysi (1) stress (1) physic (1) mechan (1) layout (1)
Person: Valeriy Sukharev
DBLP: Sukharev:Valeriy
Contributed to:
201520142010Wrote 3 papers:
- DAC-2015-ChenTSHK #analysis #modelling #multi #reliability
- Interconnect reliability modeling and analysis for multi-branch interconnect trees (HBC, SXDT, VS, XH, TK), p. 6.
- DAC-2014-HuangYST #assessment #grid #network #power management
- Physics-based Electromigration Assessment for Power Grid Networks (XH, TY, VS, SXDT), p. 6.
- DAC-2010-JoshiSTASB #modelling
- Closed-form modeling of layout-dependent mechanical stress (VJ, VS, AT, KA, DS, DB), pp. 673–678.