Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
A BIST Scheme for On-Chip ADC and DAC Testing
DATE, 2000.
@inproceedings{DATE-2000-HuangOC,
author = "Jiun-Lang Huang and Chee-Kian Ong and Kwang-Ting Cheng",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840041",
isbn = "0-7695-0537-6",
pages = "216--220",
publisher = "{IEEE Computer Society}",
title = "{A BIST Scheme for On-Chip ADC and DAC Testing}",
year = 2000,
}