@inproceedings{DATE-2000-WenL,
	author        = "Yun-Che Wen and Kuen-Jong Lee",
	booktitle     = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2000.840042",
	isbn          = "0-7695-0537-6",
	pages         = "221--225",
	publisher     = "{IEEE Computer Society}",
	title         = "{An on Chip ADC Test Structure}",
	year          = 2000,
}