Travelled to:1 × Brazil
1 × USA
3 × France
Collaborated with:M.A.Breuer Y.Wen T.Lu C.Chen T.Hsieh C.Njinda H.Chen C.Wu K.S.Li
Talks about:test (3) base (3) methodolog (1) breakpoint (1) processor (1) techniqu (1) structur (1) handshak (1) granular (1) switest (1)
Person: Kuen-Jong Lee
DBLP: Lee:Kuen=Jong
Contributed to:
2015
200820072000
1992Wrote 5 papers:
- DATE-2015-ChenWLL #debugging
- A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC (HCC, CRW, KSML, KJL), pp. 1281–1284.
- SAC-2008-LuCL #embedded #hybrid #self
- A hybrid software-based self-testing methodology for embedded processor (THL, CHC, KJL), pp. 1528–1534.
- DATE-2007-HsiehLB #detection #fault #reduction
- Reduction of detected acceptable faults for yield improvement via error-tolerance (TYH, KJL, MAB), pp. 1599–1604.
- DATE-2000-WenL
- An on Chip ADC Test Structure (YCW, KJL), pp. 221–225.
- DAC-1992-LeeNB #generative #named #testing
- SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits (KJL, CN, MAB), pp. 26–29.