IDDT Testing of Embedded CMOS SRAMs
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Suriya Ashok Kumar, Rafic Z. Makki, David M. Binkley
IDDT Testing of Embedded CMOS SRAMs
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-KumarMB,
	acmid         = "874426",
	author        = "Suriya Ashok Kumar and Rafic Z. Makki and David M. Binkley",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998473",
	isbn          = "0-7695-1471-5",
	pages         = "1117",
	publisher     = "{IEEE Computer Society}",
	title         = "{IDDT Testing of Embedded CMOS SRAMs}",
	year          = 2002,
}

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