Sandeep Kumar Goel, Erik Jan Marinissen
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips
DATE, 2005.
@inproceedings{DATE-2005-GoelM,
author = "Sandeep Kumar Goel and Erik Jan Marinissen",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.231",
isbn = "0-7695-2288-2",
pages = "44--49",
publisher = "{IEEE Computer Society}",
title = "{On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips}",
year = 2005,
}