Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
DATE, 2005.
@inproceedings{DATE-2005-LiTW,
author = "Jin-Fu Li and Tsu-Wei Tseng and Chin-Long Wey",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.56",
isbn = "0-7695-2288-2",
pages = "574--579",
publisher = "{IEEE Computer Society}",
title = "{An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories}",
year = 2005,
}











