Worst-Case and Average-Case Analysis of n-Detection Test Sets
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Irith Pomeranz, Sudhakar M. Reddy
Worst-Case and Average-Case Analysis of n-Detection Test Sets
DATE, 2005.

DATE 2005
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@inproceedings{DATE-2005-PomeranzR,
	author        = "Irith Pomeranz and Sudhakar M. Reddy",
	booktitle     = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2005.330",
	isbn          = "0-7695-2288-2",
	pages         = "444--449",
	publisher     = "{IEEE Computer Society}",
	title         = "{Worst-Case and Average-Case Analysis of n-Detection Test Sets}",
	year          = 2005,
}

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